Type II EMC Probe Conducted emission&Space radiation Rectification Magnetic Electric-field Near-field Probe oscilloscope probe

Product Features

This Type II EMC probe, suitable for conducted emission and space radiation rectification, is a magnetic-electric field near-field probe for oscilloscopes.
It helps in accurately detecting and analyzing electromagnetic interference, ensuring the proper functioning of electronic devices.
Made in Mainland China with high-quality materials, it meets the requirements of professional oscilloscope use.
As an essential oscilloscope probe and accessory, it offers reliable performance in various testing scenarios.
Whether for research, development, or quality control, this EMC probe is a valuable tool for electromagnetic measurement.